Announcement highlights the commercial availability of Glass Defect Inspection products
San Jose, Calif. (August 1, 2024) — Nano Span Technologies, LLC (Nanospan), a leading provider of production inspection and metrology equipment, today announced the commercial availability of the Glass Defect Inspection (GDI) product line. The GDI product line offers both standalone and fully automated tools for micro and macro glass inspection requirements in wafer and panel format.
According to Barton Katz, President and Chief Commercial Officer of Nanospan, “Based upon customer requirements, Nanospan has designed and is delivering products for glass substrate inspection and metrology, with an emphasis on high-volume manufacturing (HVM) applications for glass panels. The Glass Defect Inspection product line has unique, high-speed inspection and metrology capabilities for advanced packaging applications using glass panel substrates. Whether the need to detect defects and contamination, or measure bumps and troughs, the Nanospan GDI product line meets any and all requirements.”
Nanospan offers both macro and micro inspection and metrology products for wafer and panel applications in R&D and HVM environments. Sherlock, IRQS, and Clarity Pro encompass the core of the Nanospan product line for surface, sub-surface, and through substrate applications.
About Nanospan Technologies
Nanospan manufactures defect inspection and metrology equipment for customers involved in Silicon Wafer Characterization, Silicon Carbide (SiC) Ingot and Wafer Characterization, Bonded Wafer Characterization, Wafer Stress Characterization, and Glass Panel Inspection. Nanospan was founded by industry veterans and has been designing and manufacturing semiconductor manufacturing equipment since 2018.
More Information:
For more information on Nanospan Technologies and their full line of products, please visit www.nanospantechnologies.com or contact Nanospan Technologies directly at [email protected].