Announcement highlights the official launch of the company
San Jose, Calif. (January 1, 2019) — Nano Span Technologies, LLC (Nanospan), a leading provider of production inspection and metrology equipment, today announced the commercial availability of the Clarity Pro product line. The Clarity Pro product line offers both standalone and fully automated tools for micro inspection requirements of silicon, silicon carbide, gallium nitride, diamond, and glass substrates.
According to Barton Katz, President and Chief Commercial Officer of Nanospan, “Clarity Pro is the first surface analysis and defect review tool to have the combined capabilities of a scanning electron microscope (SEM) and atomic force microscope (AFM) in one tool. It provides <1nm z-height detection capability to quickly characterize any surface in a matter of minutes. The software interface is the easiest to use of any system in the marketplace.”
Nanospan offers both macro and micro inspection and metrology products for wafer and panel applications in R&D and HVM environments. Sherlock and Clarity Pro encompass the core of the Nanospan product line for surface and sub-surface ubstrate applications, with additional products under development for applications using other form factors and substrates beyond silicon including silicon carbide, gallium nitride, glass, and diamond.
About Nanospan Technologies
Nanospan Technologies manufactures defect inspection and metrology equipment for customers involved in Silicon Wafer Characterization, Silicon Carbide (SiC) Ingot and Wafer Characterization, Bonded Wafer Characterization, Wafer Stress Characterization, and Glass Panel Inspection. Nanospan Techologies was founded by industry veterans and has been designing and manufacturing semiconductor manufacturing equipment since 2018.
More Information:
For more information on Nanospan and their full line of products, please visit www.nanospantechnologies.com or contact Nanospan directly at [email protected].