Nano Span Technologies, LLC Announces the Launching of the Company as Nanospan Technologies (Nanospan)

Announcement highlights the official launch of the company San Jose, Calif. (August 31, 2018) — Nano Span Technologies, LLC (Nanospan), a leading provider of production inspection and metrology equipment, today announced the official launch of the company. According to Barton Katz, President and Chief Commercial Officer of Nanospan, “Nanospan was originally contemplated as far back…

Nano Span Technologies (Nanospan) Announces the Introduction of the Sherlock Defect Inspection Product Line for Wafer Applications

Announcement highlights the official launch of the company San Jose, Calif. (January 1, 2019) — Nano Span Technologies, LLC (Nanospan), a leading provider of production inspection and metrology equipment, today announced the commercial availability of the Sherlock product line. The Sherlock product line offers both standalone and fully automated tools macro inspection requirements of silicon, silicon…

Nano Span Technologies (Nanospan) Announces the Introduction of the Clarity Pro Defect Inspection Product Line

Announcement highlights the official launch of the company San Jose, Calif. (January 1, 2019) — Nano Span Technologies, LLC (Nanospan), a leading provider of production inspection and metrology equipment, today announced the commercial availability of the Clarity Pro product line. The Clarity Pro product line offers both standalone and fully automated tools for micro inspection requirements…

Nano Span Technologies (Nanospan) Announces the Introduction of the IRQuickScan (IRQS) Defect Inspection Product Line

Announcement highlights the official launch of the company San Jose, Calif. (January 1, 2020) — Nano Span Technologies, LLC (Nanospan), a leading provider of production inspection and metrology equipment, today announced the commercial availability of the IRQuickScan (IRQS) product line. The IRQS product line offers both standalone and fully automated tools for through-substrate micro and macro…